PURCHASE OF LINEAR INTEGRATED CIRCUITS LAB COMPONENTS for ELECTRONICS AND CIRCUITS LABORATORY

IC Tester – Digital No. personality cards / reference IC/IC data required. Automatic testing of ICs at 4.75V & 5.25V to locate marginally bad ICs. Continuous mode for testing ICs until Aborted. Number of times the test was successful is displayed. STEP mode to locate faulty pin through discrete LEDs for ICs upto 20 pins. Auto Search to find the number of unknown good digital IC with facility to locate its pinout. functional equivalents/or ICs upto 20 pins Memory test/or EPROM Indicates non blank location address with data content. For RAMs bad location address is displayed. Buzzer to indicate bad IC, Separate field for display of mode of operation (ONE!CON/STP). Current drawn is displayed in a separate field for GOOD ICs. Backspace, clear and double digit entry keys for editing IC number Remembers IC Numbers for repeated testing of same iC SELFTEST facility during power ON and through keyboard. Potential free 20 pin and 40 pin ZIF (Zero Insertlon force) sockets Protection against wrong Insertion of IC under test.

Bridge rectifier Trainer Kit Circuit diagram in the front panel Biasing components provided Test points are terminated at banana connector Input: 230V AC Housed in a closed cabinet Detailed Experimental Manual 2mm Patch chords provided for inter connecting

Diode characteristics trainer kit Circuit diagram in the front panel Biasing components provided Test points are terminated at banana connector Input: 230V AC Housed in a closed cabinet Detailed Experimental Manual 2mm Patch chords provided for inter connecting

MOSFET Characteristics Trainer Kit 2mm Patch chords provided for inter connecting Circuit diagram in the front panel Biasing components provided Test points are terminated at banana connector Input: 230V AC Housed in a closed cabinet Detailed Experimental Manual 2mm Patch chords provided for inter connecting

Frequency Response of CS Amplifier Trainer Kit 2mm Patch chords provided for inter connecting Circuit diagram in the front panel Biasing components provided Test points are terminated at banana connector Input: 230V AC Housed in a closed cabinet Detailed Experimental Manual 2mm Patch chords provided for inter connecting

Frequency Response of Cascode Amplifier Trainer Kit Circuit diagram in the front panel Biasing components provided Test points are terminated at banana connector Input: 230V AC Housed in a closed cabinet Detailed Experimental Manual

I/O characteristics of a Common Emitter Amplifier Trainer Kit 2mm Patch chords provided for inter connecting Circuit diagram in the front panel Biasing components provided Test points are terminated at banana connector Input: 230V AC Housed in a closed cabinet Detailed Experimental Manual 2mm Patch chords provided for inter connecting

Differential amplifier trainer kit Circuit diagram in the front panel Biasing components provided Test points are terminated at banana connector Input: 230V AC Housed in a closed cabinet Detailed Experimental Manual 2mm Patch chords provided for inter connecting

Class A Transformer Coupled Power Amplifier Trainer Kit 2mm Patch chords provided for inter connecting Circuit diagram in the front panel Biasing components provided Test points are terminated at banana connector Input: 230V AC Housed in a closed cabinet Detailed Experimental Manual 2mm Patch chords provided for inter connecting

Transistor Feedback amplifier trainer kit\ 2mm Patch chords provided for inter connecting Circuit diagram in the front panel Biasing components provided Test points are terminated at banana connector Input: 230V AC Housed in a closed cabinet Detailed Experimental Manual 2mm Patch chords provided for inter connecting